Date：2024-05-10 13:32:17

The cold and hot impact test chamber (also known as the high and low temperature impact test chamber) is a device used to test the tolerance of products. By constantly changing the temperature, it detects whether the product is damaged. The thermal and cooling effects generated will simulate climate change in various extreme scenarios. During the development phase, it can be used to detect product design and process defects, as well as for environmental stress screening, to eliminate early product failures. The severity of the test depends on factors such as high and low temperature range, residence time, temperature conversion time, and number of cycles. So what should be noted when using a high and low temperature impact test chamber? View >>

Date：2024-05-09 14:58:55

HAST high acceleration life testing is an important tool for evaluating product reliability by simulating harsh environmental conditions. This testing method accelerates the aging process of products by applying high temperature, high humidity, and high pressure conditions, thereby detecting the performance and durability of products in a short period of time. In today's fiercely competitive market, product reliability has become an important factor in consumer choice. Therefore, HAST high acceleration life testing has become an indispensable testing method in many industries. View >>

Date：2024-05-08 13:58:50

In the field of power electronics, IGBT (Insulated Gate Bipolar Transistor) chips play a crucial role and are widely used in various power electronic devices. In order to ensure the reliability and stability of IGBT chips, strict testing is required in their design and manufacturing process, among which cold and hot shock testing is one of the crucial steps. The cold and hot shock test aims to simulate the extreme temperature changes that IGBT chips may encounter in practical applications, in order to evaluate their performance and reliability under various environmental conditions. View >>

Date：2024-05-08 13:58:35

HAST high acceleration life test is a testing method that achieves accelerated aging of products by applying high temperature, high humidity, and high pressure to the sample. Widely used in industries such as PCB, IC semiconductor, connectors, circuit boards, magnetic materials, polymer materials, EVA, photovoltaic modules, etc. for accelerated aging life testing, to evaluate product sealing, moisture absorption, and aging performance. View >>

Date：2024-05-07 15:15:52

As a product that integrates advanced mechanical and electronic technology, the safety, stability, and reliability of automobiles are undoubtedly the core elements. Car grade chips, as the "heart" of cars, their performance directly affects the overall performance of the car. Therefore, conducting comprehensive and rigorous testing of automotive grade chips is not only a necessary means to ensure car quality, but also a key link in ensuring driving safety. View >>

Date：2024-05-07 15:15:43

With the rapid development of information technology, integrated circuit (IC) chips have become the core components of modern technological products, and their performance, quality, and reliability directly affect the operational effectiveness of the entire system. Due to the trend of miniaturization and complexity in IC chips, traditional detection methods are no longer able to meet the precise identification requirements for internal structures and defects. At this time, X-ray detection equipment has emerged as a non-destructive and efficient detection technology, becoming an important tool for quality control of IC chips. View >>

Date：2024-05-06 14:07:28

With the rapid development of automotive technology, high and low temperature testing of automotive grade chips has become particularly important. These chips carry the core functions of automotive systems, such as autonomous driving, in car entertainment, and vehicle network connectivity. However, under extreme temperature conditions, these chips may encounter various challenges, including performance degradation, stability issues, and even malfunctions. Therefore, conducting comprehensive high and low temperature testing on automotive grade chips is a crucial step in ensuring the safe and reliable operation of automotive systems. View >>

Date：2024-05-06 14:07:20

HASS (High Accelerated Stress Screening) testing is a method used to accelerate the discovery and elimination of manufacturing defects. It is a highly effective quality assurance tool widely used in various industries, including electronics, aerospace, and automotive manufacturing. This article will introduce the concept, process, and importance of HASS testing in various industries. View >>

Date：2024-04-29 10:13:56

Reliability testing is the process of evaluating the performance and reliability of electronic devices under specific environmental conditions. For IC chip devices, reliability testing is particularly important because they are widely used in various critical systems, such as automobiles, aerospace, medical equipment, etc. When conducting reliability testing of IC chip devices, the following aspects are usually involved: View >>

Date：2024-04-29 10:13:23

The discharge test of capacitors is one of the important tests to test the performance of capacitors. Through the discharge test, the performance of capacitors during the discharge process can be determined, and their quality, reliability, and safety can be further evaluated. The following are the steps for conducting a capacitor discharge test: View >>