Date：2023-05-19 14:23:04

Electron spectroscopy (EDS) is an analytical instrument widely used in fields such as geology, materials science, and life sciences, which can measure the chemical composition and microstructure of sample surfaces. What is the working principle of an EDS spectrometer? How to use EDS spectrometer for third-party testing institutions? This article will provide you with an answer. View >>

Date：2023-05-18 14:44:02

Chip DPA analysis is an advanced technology aimed at evaluating the security and key strength of chips. DPA analysis can be carried out by collecting current and power waveforms, analyzing power and current waveforms, verifying analysis results, and changing algorithms or parameters. In this article, we will delve into the key aspects of chip DPA analysis and its importance in chip protection. View >>

Date：2023-05-18 14:43:50

DPA (Differential Power Analysis) detection is an attack method used to attack cryptographic devices and applications. It utilizes physical phenomena such as differences in power consumption or electromagnetic radiation of devices under different input conditions to gradually leak keys or sensitive information, thereby cracking passwords. The importance of DPA detection is extremely prominent, as it can identify security vulnerabilities before detecting attacks and fix them in a timely manner, thereby improving the security and reliability of products. View >>

Date：2023-05-18 14:43:40

DPA (Differential Power Analysis) is a method of analyzing cryptographic devices and algorithms, typically used to evaluate the security of devices. In professional testing of components, DPA is often used to evaluate the performance of components and help engineers identify potential problems and optimize solutions. By analyzing these changes, attackers can extract confidential information and even crack device keys and algorithms. View >>

Date：2023-05-17 16:21:19

In the field of components, FMEA and DPA are two common failure mode and impact analysis tools. Although both tools aim to help teams identify and solve potential problems, their purpose, application, and expression of results differ. This article will introduce the differences between FMEA and DPA, and provide practical suggestions to help teams better utilize these two tools. View >>

Date：2023-05-17 16:21:16

Digital Signal DPA (Differential Power Analysis) technology is a method used to detect devices. DPA (Differential Power Analysis) detection technology is a method of cracking encryption algorithms by analyzing the power consumption waveform of devices or systems. This technology is receiving increasing attention because DPA detection is a technique used to verify whether devices and systems have safety performance. It analyzes current and power waveforms to identify potential vulnerabilities or defects in the device. However, many people believe that using DPA technology cannot identify refurbished components. So, can DPA technology detect refurbished metadevices? View >>

Date：2023-05-17 16:20:54

X-ray testing machine is a commonly used non-destructive testing instrument, widely used in industrial production and quality testing fields. To ensure the accuracy and effectiveness of testing, it is crucial to use X-ray testing machines correctly. This article will introduce the usage methods of X-ray testing machines. View >>

Date：2023-05-16 15:04:10

With the increasing complexity and high-performance requirements of electronic products, the design and manufacturing of circuit boards have become increasingly complex. Therefore, circuit board inspection has become a very important part of the production process. Traditional circuit board detection methods include visual inspection, electrical testing, and functional testing, but these methods have some drawbacks, such as low accuracy, low efficiency, and susceptibility to human errors. To help everyone gain a deeper understanding, the following content is organized by Chuangxin Testing Network and provided for your reference. View >>

Date：2023-05-16 15:04:01

IC chips are the core components of electronic devices that are not modern electronic products. IC chips have very complex mechanisms and structures, so in practical use, how to detect whether IC chips are normal has become a very important issue. This article will introduce how to detect whether the IC chip is functioning properly. View >>

Date：2023-05-16 15:03:52

X-ray inspection is a commonly used non-destructive testing method that can be used to detect the presence of defects or malfunctions in products. In the manufacturing of electronic products, X-ray inspection is commonly used to detect defects or malfunctions in IC chips. This article will introduce X-ray inspection product projects and methods for detecting IC chips. View >>