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Main precautions for mechanical impact testing of electronic products

Date:2024-03-14 11:38:31

Mechanical impact testing mainly simulates the impact effects that equipment and its components may encounter during transportation or use, and analyzes the product's ability to withstand external impact environments through transient energy exchange through shock waves. The intention of the experiment is to understand its structural weaknesses and functional degradation, which helps to understand the structural strength and appearance resistance to impact, drop, and other characteristics of the product. Effectively evaluate the reliability of products and monitor the consistency of production line products. View >>

Exploring the thermal management and fault analysis of IGBT in three-phase inverter circuits

Date:2024-03-14 11:38:25

As one of the typical applications of IGBT, three-phase inverter circuit has a wide range of application fields and huge differences. IGBT needs to withstand different speed requirements in different application scenarios, from wind turbines to automotive engines, thus facing continuous to short pulse loads. This working state generates a large amount of heat, which brings huge thermal and mechanical stress to the device. To address this issue, intelligent design, material science, and effective cooling technologies have all become key factors. View >>

How to distinguish the authenticity of chips through detection?

Date:2024-03-13 16:21:23

Chips are an important component of modern electronic devices, and their quality and authenticity directly affect the performance and reliability of the equipment. Therefore, how to distinguish the authenticity of chips through detection is a very important issue. This article will introduce several common methods for chip authenticity detection. View >>

IGBT module detection methods and techniques

Date:2024-03-13 16:21:21

According to the equivalent circuit diagram of IGBT, it can be seen that if a driving positive voltage is applied between the gate G and the emitter E of IGBT, the MOSFET will conduct. This results in a low resistance state between the collector C and the base of the PNP transistor, causing the transistor to conduct; If the voltage between the gate and emitter of IGBT is 0V, the MOS is cut off, cutting off the supply of base current to the PNP transistor, causing the transistor to cut off. IGBT, like MOSFET, is also a voltage controlled device. A DC voltage of more than ten volts is applied between its gate G and emitter E, and only a leakage current at the uA level flows through, basically not consuming power. View >>

How to test the quality of IC chips? Elaborate on key testing items

Date:2024-03-12 15:48:13

As the core component of electronic devices, the performance of integrated circuit (IC) chips directly determines the quality and reliability of the overall product. Therefore, comprehensive and meticulous testing of IC chips is crucial in production, use, and maintenance processes. The following will provide a detailed introduction to the main testing items used to test the quality of IC chips: View >>

Basic requirements for routine testing reports

Date:2024-03-12 15:48:01

Routine testing reports refer to reports prepared after routine testing, testing, and analysis of products, substances, or services. To ensure the quality and reliability of testing reports, routine testing reports usually need to meet the following basic requirements: View >>

How to judge the quality of IGBT power transistors?

Date:2024-03-11 15:50:54

With the increasing advancement and efficiency of power electronics technology, IGBT has become a popular choice for industrial applications. IGBT (Insulated Gate Bipolar Transistor) is a three terminal semiconductor device that supports high voltage and high current applications while providing fast switching speed. Like any other electronic device, IGBTs also experience performance degradation and may fail due to various factors. Therefore, it is crucial to test the good or poor condition of IGBT before using it in power electronic circuits to prevent any potential catastrophic damage to the equipment and avoid financial losses. In this article, we will discuss various methods for testing the good or bad state of IGBT. View >>

Analyzing the causes and solutions of IGBT short-circuit oscillation phenomenon

Date:2024-03-11 15:50:42

IGBT, also known as insulated gate bipolar transistor, is a power semiconductor device widely used in fields such as motor drive, power conversion, and energy management. The structure of IGBT includes P+collector, N-drift region, P-base region, and N+emitter. When a positive voltage is applied between the gate and emitter, the IGBT conducts, allowing current to flow from the collector to the emitter. View >>

IGBT Short Circuit Testing: A Deep Analysis of Principles and Guidelines for Experimental Methods

Date:2024-03-07 16:23:26

IGBT (Insulated Gate Bipolar Transistor) is a commonly used power semiconductor device with advantages such as fast switching speed and low loss. It is widely used in industries, transportation, medical and other fields. However, IGBT may experience short circuit faults during use, seriously affecting the normal operation of the equipment. Therefore, conducting short-circuit testing on IGBTs is essential. This article will deeply analyze the principle of IGBT short-circuit testing and provide experimental method guidelines to help readers better understand and master this important testing technology. View >>

How to detect chip failure? Methods for Judging the Quality of Integrated Circuits

Date:2024-03-07 16:23:17

Integrated Circuit (IC) is an indispensable component of modern electronic devices, widely used in various fields such as computers, mobile phones, automobiles, medical devices, etc. However, due to various reasons, the IC may fail, leading to equipment failure or instability. Therefore, how to detect chip failures and judge the quality of ICs has become an important issue. View >>

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