Date：2021-04-27 15:35:00

Circuit failure is a headache for every engineer. During the use of electronic components, failures and faults will also occur, which will affect the normal operation of the equipment. Let's learn about the failure analysis and failure causes of electronic components. If you are familiar with the fault types of components, sometimes you can quickly find the fault components through intuition, and sometimes you can find the fault through simple resistance and voltage measurement. View >>

Date：2021-04-26 17:52:00

Diode is called crystal diode, which is a kind of semiconductor device, also known as semiconductor diode. The structure of crystal diode is a p-n junction structure formed by p-type nodule semiconductor and n-type nodule semiconductor. Respective space charge layers are formed on both sides of the nodule, and the equivalent of self built electric field is built. If there is no applied voltage, due to p-n  The diffusion current caused by the carrier concentration difference on both sides of the junction is equal to the drift current caused by the self built electric field. View >>

Date：2021-04-26 16:47:42

PCB circuit board is the foundation and highway of electronic components, also known as printed circuit board. It is the provider of electrical connection of electronic components. Its development has a history of more than 100 years; Its design is mainly layout design; The main advantage of using circuit board is to greatly reduce wiring and assembly errors, and improve the automation level and production labor rate. The quality of PCB is very important. To check the quality of PCB, a number of reliability tests must be carried out. This article is an introduction to testing. Let's have a look. View >>

Date：2021-04-26 16:41:00

Generally speaking, the failure of integrated circuits is inevitable in the process of development, production and use. With the continuous improvement of people's requirements for product quality and reliability, failure analysis is becoming more and more important. Chip failure analysis can help integrated circuit designers find design defects, mismatch of process parameters or improper design and operation. The common methods of chip failure analysis are no more than those processes. The most important thing is to rely on various advanced and accurate electronic instruments. The following contents are mainly elaborated from these two aspects, hoping to be helpful to you. View >>

Date：2021-04-26 16:36:00

The transformer can be tested with a multimeter. As shown in the figure, the first is to detect the on-off of the winding coil, the second is to detect the insulation resistance between the winding coils, and the third is to detect the insulation resistance between the winding coil and the iron core. View >>

Date：2021-04-26 16:29:00

Failure analysis is an important part of chip testing. Whether for mass-produced samples, design links or customer returned products, failure analysis can help reduce costs and shorten the cycle. Common failure analysis methods include decap, X-ray, IV, Emmi, FIB, SEM, EDX, probe, OM, RIE, etc. because failure analysis equipment is expensive, most demand units can not match or complete the required equipment. Therefore, it is also a good choice to use external forces and open resources to complete their own analysis. What information do we need to prepare when we choose to test outside? Let's sort it out for you: View >>

Date：2021-04-26 16:19:00

The ability or possibility of the product to perform the specified function without failure under certain time or conditions. The reliability of products can be evaluated by reliability, failure rate and mean time between failures. Moreover, this is an important quality index. Only qualitative description is not enough. It must be quantified in order to make accurate description and comparison. View >>

Date：2021-04-26 16:17:00

Reliability test is a means to investigate, analyze and evaluate the reliability of products. The test results provide a basis for fault analysis, study the corrective measures taken and judge whether the product meets the index requirements. According to the method and purpose of reliability statistical test, reliability statistical test can be divided into reliability verification test and reliability measurement test. Reliability measurement test is a test for measuring reliability characteristics or their values, which is usually used to provide reliability data. Reliability verification test is used to verify whether the reliability characteristic value of equipment meets the specified reliability requirements. Generally, reliability identification and acceptance test are collectively referred to as reliability verification test. View >>

Date：2021-03-05 11:12:00

According to the news released on the 10th by the "customs release" of the wechat platform of the General Administration of customs, the brand owner confirmed that a batch of 391500 printed circuit boards previously seized by Futian customs under Shenzhen Customs in the freight export channel infringed the exclusive right of "ru" trademark of UL company. View >>

Date：2021-03-05 10:53:00

According to recent media reports, memory is returning to the price increase mode. From December last year to January this year, the varieties with the most increase have reached 30%. According to the market website data, the prices of various memory modules and memory particles began to rise in early December, and there is still no intention to stop. View >>