Electronic product quality related standards focus on chip IC testing institutions

Date：2021-12-31 16:34:29Views：1203

With the increasing demand for miniaturization of electronic equipment, there are more and more functions of a single chip. In the prior art, in order to ensure the quality of the chip, the process from design molding to mass production usually includes the chip detection stage.

Integrated circuit, English is integrated circuit, abbreviated as IC; As the name suggests, it is a circuit with specific functions that integrates a certain number of common electronic components, such as resistors, capacitors, transistors, etc., as well as the wiring between these components through semiconductor technology.

Detection range

Electronic components: resistors, capacitors, inductors, field effect transistors, triodes, diodes, electrical connectors, etc;

Integrated circuit: digital integrated circuit (small scale integrated circuit and large scale integrated circuit), semiconductor integrated circuit, etc.

Test items

Environmental reliability, mechanical, physical and life test.

Relevant test standards

Gjb360b test methods for electronic and electrical components temperature shock test

GB / T 2423.11 environmental testing for electric and electronic products - Part 2: Test methods Test FD: broadband random vibration - General requirements

GJB 360a test method for electronic and electrical components

GJB 1420a general specification for semiconductor integrated circuit enclosures

GJB 128A test method for semiconductor discrete devices

GJB 3157 failure analysis method and program for semiconductor discrete devices

GJB 3233 failure analysis program and method for semiconductor integrated circuits

GJB 548a test methods and procedures for microelectronic devices

GJB 548b test methods and procedures for microelectronic devices

GJB 5914 destructive physical analysis method for military semiconductor devices of various quality levels

Gjb128a semiconductor discrete device test method 1071 seal

Semiconductor devices -- integrated circuits -- Part 2: digital integrated circuits

Gjb597a general specification for semiconductor integrated circuits

GB / t6798 basic principles of test methods for voltage comparators for semiconductor integrated circuits

Semiconductor discrete devices and integrated circuits -- Part 7: Bipolar Transistors

Semiconductor devices -- Discrete devices -- Part 8: field effect transistors

GB / T 4023 semiconductor devices: discrete devices and integrated circuits Part 2: Rectifier Diodes

GB / t2693 fixed capacitors for electronic equipment

GB / t5729 fixed resistors for electronic equipment

Gjb1217a electrical connector test method, etc.

Chuangxin testing always adheres to the purpose of "professional, authoritative, efficient and innovative". It has invested heavily in purchasing international advanced testing equipment. The testing is in strict accordance with international testing standards and methods. It has obtained CNAs certification and international mutual recognition qualification. Its customer base covers many countries and regions at home and abroad. It is a professional IC testing institution with excellent quality and high popularity in China. It can undertake a variety of test items such as electronic component test and verification, IC true and false identification, product design, material selection, failure analysis, function test, factory incoming material inspection and tape braiding.