What are the chip function detection methods? Third party testing organization
Date:2021-10-19 14:25:00Views:2160
With the increasing demand for miniaturization of electronic equipment, there are more and more functions of a single chip. In the prior art, in order to ensure the quality of the chip, the process from design molding to mass production usually includes the chip detection stage. However, the traditional chip debugging technology is a set of test program for the function additionally developed based on the chip function. It usually can only detect whether the chip has errors or faults, and can not accurately locate the errors in the chip terminal. It can only be judged by the experience of the tester, resulting in the slow speed and low efficiency of chip detection.
Chip is the general term of semiconductor component products, also known as microcircuit, microchip and integrated circuit. It refers to the silicon wafer containing integrated circuits. It is very small and often part of computers or other electronic equipment. All the components have formed a whole in structure, which makes the electronic components take a big step towards miniaturization, low power consumption and high reliability. It is represented by the letter "IC" in the circuit. The inventors of integrated circuits were Jack Kilby (silicon based integrated circuits) and Robert neuth (germanium based integrated circuits). Most of the applications in today's semiconductor industry are silicon-based integrated circuits.
1. Software implementation
According to the data comparison requirements of input excitation and output response of "power forming core", a comprehensive Verilog code is written. The design of the code is fully implemented in accordance with the timing requirements of "power generation core".
According to the design idea of establishing test platform based on programmable devices, the construction methods of functional test platform are as follows: programmable logic devices are used to generate input excitation and process output response; ROM is used to store DSP core program, control register parameters, pulse pressure coefficient and filter coefficient; SRAM is used as off chip cache.
2. Hardware implementation
According to the implementation block diagram of the function test platform, the schematic diagram and PCB are designed. Finally, a system platform that can test the function of the "power core" is designed and completed.
Programmable logic device classification:
1. Circuits in fixed logic devices are permanent. They complete one or a group of functions - once manufactured, they cannot be changed.
2. Programmable logic devices (PLDs) are standard finished components that can provide customers with a wide range of logic capabilities, characteristics, speed and voltage characteristics - and such devices can be changed at any time to complete many different functions.
As the core component of electronic products, the quality of the chip tends to be better. In order to ensure the quality of the chip, effective detection technology has been used to detect the function of the chip. With the increase of design complexity, the workload and difficulty of chip verification increase in the order of magnitude. By running complex simulation on the design engineering, the verification engineer shows the functions described in the chip product specification one by one through binary waveforms. How to deal with the complex and huge state space and how to detect incorrect behavior are the great challenges faced by the verification engineer.
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