What are the configurations of electronic component testing and screening equipment?

Date：2021-08-02 18:15:08Views：1508

Whether electronic equipment can work reliably is based on whether electronic components can work reliably. If the early failure components are installed on the whole machine and equipment, the early failure rate of the whole machine and equipment will be greatly increased, its reliability can not meet the requirements, and it will have to pay a great price for maintenance. Therefore, before the electronic components are installed on the whole machine and equipment, we should try to eliminate the components with early failure as much as possible. Therefore, we should screen the components.

General requirements for testing and screening of electronic components: 1 Non destructive test without changing the inherent reliability of components; 2. 100% screening of batch products; 3. Eliminate early failure products and improve the reliability of components; 4. The screening level is determined by the expected working conditions and service life of components.

The test and screening of electronic components involves a large number of instruments and equipment. The following is the list of relevant test items and testing instruments and equipment for the test and screening of electronic components:

High resistance meter Withstand voltage tester Semiconductor Parameter Test System High precision plotter network analyzer Signal generator Spectrum analyzer Digital integrated circuit test system Analog integrated circuit test system Relay test system Power module test system Shaking table: vibration test Constant acceleration test bench: constant acceleration test Programmable power supply: voltage and power aging test Electronic load: current and power aging Particle impact noise tester Hybrid IC high temperature dynamic aging system High temperature aging detection system of power module High temperature aging test system for crystal oscillator Integrated aging detection system for discrete devices Discrete device intermittent life test system Capacitor high temperature aging detection system High power transistor aging detection system Relay low level life screening system Level life screening system in relay Relay high level life screening system metallurgical microscope Fluorocarbon crude leak detector Ultrasonic scanning microscope

Test items	Testing instruments and equipment
Electrical test	Impedance analyzer
	LCR, ohmmeter, etc
Environmental and stress screening	High and low temperature test chamber: thermal cycle test
Life / aging / aging test	Monolithic integrated circuit high temperature dynamic aging system
Appearance inspection	optical microscope
Seal detection	Helium mass spectrometer leak detector
X-ray radiography	X-ray transmission system
Scanning acoustic microscopy	Acoustic scanning detection equipment