The Principle and Application of Scanning Electron Microscope SEM

Date：2023-08-08 17:30:00Views：293

Scanning Electron Microscope (SEM) is a high-resolution electron microscope that can be used for high-resolution imaging and chemical analysis of sample surfaces. The principle of SEM is to use the interaction between the electron beam and the sample surface to generate secondary or backscattered electron signals, which are detected and imaged through detectors. SEM has the advantages of high resolution, high sensitivity, high depth resolution, and chemical analysis, and is widely used in fields such as materials science, biology, geology, electronics, etc.

The working principle of SEM is to use the interaction between the electron beam and the sample surface to generate secondary or backscattered electron signals, which are detected and imaged through detectors. The electron source in SEM usually uses a hot cathode electron gun or field emission electron gun, and the generated electron beam passes through the focusing system and scanning coil, forming a high-density electron beam on the sample surface, thereby interacting with the sample surface. When the electron beam interacts with the surface of the sample, secondary or backscattered electron signals are generated, which can be detected by the detector and imaged through signal processing and imaging systems. The imaging resolution of SEM is usually at the nanometer level, which can provide high-resolution imaging of the sample surface.

In physics, SEM is commonly used to study the microstructure and properties of matter, such as electron transport, photoelectric effects, etc. In the field of chemistry, SEM can be used to study surface reactions and changes in material structure, such as catalytic reactions and chemical adsorption. In materials science, SEM can be used to study the microstructure, morphology, and composition of materials, such as metals, ceramics, polymers, and biomaterials. In biology, SEM can be used to study the morphology and composition of microscopic biological structures such as cell structure, bacteria, viruses, and tissues.

There are many testing projects that SEM can do, and the following are some common testing projects:

Surface morphology observation:

SEM can observe the surface morphology of various materials, such as metals, ceramics, polymers, fibers, and biomaterials.

Microstructure analysis:

SEM can analyze the microstructure of various materials, such as crystal structure, grain size, fiber structure, etc.

Component analysis:

SEM can be used to analyze the chemical composition of materials, such as elemental analysis, compound analysis, etc.

Surface chemical property testing:

SEM can test the surface chemical properties of materials, such as surface activity, surface charge, etc.

Interface property testing:

SEM can test the interface properties of materials, such as interface structure, interface energy, etc.

Electron Microscopic Image Analysis:

SEM can analyze electron microscopy images, such as lines, points, and regions, to obtain information on the morphology, size, and distribution of samples.

Micro nano processing:

SEM can be used for micro/nano processing, such as lithography, electron beam exposure, ion beam engraving, etc., to manufacture various micro/nano structures.

The above is an introduction to scanning electron microscopy (SEM). If you have any needs in this regard, please feel free to consult Chuangxin Testing! SEM is a powerful high-resolution electron microscope widely used in various fields, and has significant research and applications in fields such as materials, biology, geology, and electronics.