What is destructive sampling? Characteristics of destructive testing

Date：2023-05-11 14:54:46Views：383

IC testing refers to the quality inspection and testing of integrated circuits (ICs) to ensure that they comply with various specifications and standards. In IC testing, destructive sampling is an important method that can be used to test the physical and electrical characteristics of integrated circuits, as well as detect defects and errors in ICs. In this article, we will explore the meaning, characteristics, and applications of destructive sampling.

Destructive sampling refers to the destruction of some or all components of integrated circuit devices during the testing process. Through this method, detailed information about various aspects of integrated circuits can be obtained, including their physical and electrical characteristics, device structure, functional characteristics, etc. Destructive sampling can be conducted at various stages of the IC manufacturing process, such as after chip manufacturing or during terminal testing.

The characteristic of destructive sampling is that it can provide very detailed and accurate information, detect small defects and errors, as well as various issues in the IC. Meanwhile, since destructive sampling detection is carried out in the case of complete destruction of the integrated circuit, each sample can only be tested once. This means that each experiment requires a large number of IC devices and requires a lot of time and resources, so the cost of this testing method is also high.

In IC testing, destructive sampling is widely used in various fields, such as semiconductor manufacturing, chip processing, electronic equipment, and communication technology. It can be used to detect various physical and electrical characteristics of devices, such as current, voltage, capacitance, resistance, etc. In addition, it can also be used to detect circuits and components of transistors, as well as to test the structure and functional characteristics of devices in ICs.

Overall, destructive sampling is an important IC detection method that can provide very accurate and detailed information and be used to detect various physical and electrical characteristics in ICs. The characteristic of this method is that it requires complete destruction of each sample, so a large number of IC devices are required for each test, and the cost is high. However, destructive sampling testing methods can provide valuable data and information for IC manufacturers to further improve product quality and reliability.

The above is an introduction to destructive testing. If you have any needs in this regard, please feel free to consult Chuangxin Testing!